Search results
Journal of Electronic Testing > 2019 > 35 > 3 > 413-420
Design Automation for Embedded Systems > 2019 > 23 > 1-2 > 3-19
Arabian Journal for Science and Engineering > 2018 > 43 > 12 > 6667-6692
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 211 - 215
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Transactions on Circuits and Systems for Video Technology > 2017 > 27 > 11 > 2476 - 2489
Microelectronics Reliability > 2017 > 78 > C > 38-45
Microelectronics Reliability > 2017 > 78 > C > 190-196
Journal of Electronic Testing > 2017 > 33 > 5 > 607-620
IEEE Transactions on Nuclear Science > 2017 > 64 > 9 > 2497 - 2504
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2161 - 2168
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67